137K. M. Lee, J. T. Jang, Y.-J. Baek, H. Kang, S. Choi, S.-J. Choi, D. M. Kim, C. J. Kang, T.-S. Yoon, H.-S. Mo, D. H. Kim"The γ -Fe2O3 Nanoparticle Assembly-Based Memristor Ratioed Logic and Its Optical Tuning"IEEE Electron Device Letters, Vol. 37, no. 8, pp. 986-989, DOI: 10.1109/LED.2016.2582523 , 2016-08
136H. M. Choi, D. J. Shin, J. H. Lee, H.-S. Mo, T. J. Park, B.-G. Park, D. M. Kim, S.-J. Choi, D. H. Kim, J. Park"The Analysis of Characteristics in Dry and Wet Environments of Silicon Nanowire-Biosensor"Journal of Nanoscience and Nanotechnology, vol. 16, no. 5, pp. 4901–4905, DOI: 10.1166/jnn.2016.12247, 2016-05
135J. Yoon, B. Choi, S. Choi, J. Lee, J. Lee, M. Jeon, Y Lee, J. Han, J. Lee, D. M. Kim, D. H. Kim, S. Kim, S.-J. Choi"Evaluation of interface trap densities and quantum capacitance in carbon nanotube network thin-film transistors"Nanotechnology, vol. 27, no. 29, p. 295704, DOI: 10.1088/0957-4484/27/29/295704, 2016-06
134S. K. Kim, J. Lee, D.-M. Geum, M.-S. Park, W. J. Choi, S.-J. Choi, D. H. Kim, S. Kim*, D. M. Kim* (*co-corresponding authors)"Fully Subthreshold Current-Based Characterization of Interface Traps and Surface Potential in III-V-on-Insulator MOSFETs"Solid-State Electronics, vol. 122, pp. 8-12, DOI: 10.1016/j.sse.2016.04.011, 2016-04
133S. Choi, H. Kim, C. Jo, H.-S. Kim, S.-J. Choi, D. M. Kim, J. Park, D. H. Kim"The Effect of Gate and Drain Fields on the Competition Between Donor-Like State Creation and Local Electron Trapping in In–Ga–Zn–O Thin Film Transistors Under Current Stress"IEEE Electron Device Letters, vol. 36, no. 12, pp. 1336-1339, 2015-12
132B. Choi, D. Lee, J.-H. Ahn, J. Yoon, J. Lee, M. Jeon, D. M. Kim, D. H. Kim , I. Park, Y.-K. Choi, and S.-J Choi"Investigation of optimal hydrogen sensing performance in semiconducting carbon nanotube network transistors with palladium electrodes"Applied Physics Letters, vol. 107, p. 193108, 2015-11
131J. Kim, S. Choi, J. Jang, J. T. Jang, J. Kim, S.-J. Choi, D. M. Kim, and D. H. Kim"Analysis of Instability Mechanism under Simultaneous Positive Gate and Drain Bias Stress in Self-Aligned Top- Gate Amorphous Indium-Zinc-Oxide Thin-Film Transistors"JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE, vol. 15, no. 5, pp. 526-532, 2015-10
130H. Kang, J. T. Jang, J. Kim, S.-J. Choi, D. M. Kim, and D. H. Kim"Comparative Analysis on Positive Bias Stress-Induced Instability under High VGS/Low VDS and Low VGS/High VDS in Amorphous InGaZnO Thin-Film Transistors"JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE, vol. 15, no. 5, pp.519-525, 2015-10
129Sungju Choi, Youngjin Kang, Jonghwa Kim, Jungmok Kim, Sung-Jin Choi, Dong Myong Kim, Ho-Young Cha, Hyungtak Kim, and Dae Hwan Kim"Frequency-dependent C-V Characteristic-based Extraction of Interface Trap Density in Normally-off Gate-recessed AlGaN/GaN Heterojunction Field-effect Transistors"JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE, vol. 15, no. 5, pp.497-503, 2015-10
128Jungmin Lee, Sungju Choi, Seong Kwang Kim, Sung-Jin Choi, Dae Hwan Kim, Jisun Park, and Dong Myong Kim"Modeling and Characterization of the Abnormal Hump in n-Channel Amorphous-InGaZnO Thin-Film Transistors After High Positive Bias Stress"IEEE Electron Device Letters, vol. 36, no. 10, pp.1047-1049, 2015-10
127B. Choi, J.-H. Ahn, J. Lee, J. Yoon, J. Lee, M. Jeon, D. M. Kim, D. H. Kim, I. Park, S.-J. Choi"A bottom-gate silicon nanowire field-effect transistor with functionalized palladium nanoparticles for hydrogen gas sensors"Solid-State Electronics, vol. 104 pp. 76-19, 2015-08
126H. Choi, J. Lee, H. Bae, S.-J. Choi, D. H. Kim, D. M. Kim"Bias-Dependent Effective Channel Length for Extraction of Subgap DOS by Capacitance–Voltage Characteristics in Amorphous Semiconductor TFTs"IEEE TRANSACTIONS ON ELECTRON DEVICES, vol. 62. no. 8, pp. 2689-2694, 2015-08
125J. T. Jang, J. Park, B. D. Ahn, D. M. Kim, S.-J. Choi, H.-S. Kim, D. H. Kim"Study on the Photoresponse of Amorphous In−Ga−Zn−O and Zinc Oxynitride Semiconductor Devices by the Extraction of Sub-Gap- State Distribution and Device Simulation"ACS Appl. Mater. Interfaces, vol. 28. no. 7, pp. 15570-15577, 2015-06
124J. Lee,J. Jang, B. Choi, J. Yoon, J.-Y. Kim, Y.-K. Choi, D. M. Kim, D. H. Kim, S.-J. Choi"A Highly Responsive Silicon Nanowire/Amplifier MOSFET Hybrid Biosensor"Scientific Reports, Scientific Reports 5, 2015-07
123S. Choi, H. Kim, C. Jo, H.-S. Kim, S.-J. Choi, D. M. Kim, D. H. Kim"A Study on the Degradation of In–Ga–Zn–O Thin-Film Transistors Under Current Stress by Local Variations in Density of States and Trapped Charge Distribution"IEEE ELECTRON DEVICE LETTERS, vol. 36. no. 7, pp. 690-692, 2015-06
122K. M. Lee, J. Jang, S.-J. Choi, D. M. Kim,K. R. Kim,D. H. Kim"Extraction of Propagation Delay-Correlated Mobility and Its Verification for Amorphous InGaZnO Thin-Film Transistor-Based Inverters"IEEE Transactions on Electron Devices , vol. 62. no. 5, pp. 1504-1510, 2015-05
121J. T. Jang, J. Park, B. D. Ahn, D. M. Kim, S.-J. Choi, H.-S. Kim, D. H. Kim"Effect of direct current sputtering power on the behavior of amorphous indium-galliumzinc- oxide thin-film transistors under negative bias illumination stress"Applied Physics Letters, vol. 106, p. 123505, 2015-04
120J. S. Hwang, H. Bae, J. Lee, S.-J. Choi, D. H. Kim, D. M. Kim"Sub-Bandgap Photonic Capacitance-Voltage Method for Characterization of the Interface Traps in Low Temperature Poly-Silicon Thin-Film Transistors"IEEE Electron Device Letters, vol. 36, no. 4, pp.339-341, 2015-04
119J. Lee, H. Bae, J. S. Hwang, J. Ahn, J. T. Jang, J. Yoon, S.-J. Choi, D. H. Kim, D. M. Kim"Modeling and Separate Extraction Technique for Gate Bias-Dependent Parasitic Resistances and Overlap Length in MOSFETs"IEEE Transactions on Electron Devices, vol. 62, no. 3, pp. 1063-1067, 2015-03
118B. Choi, J. Lee, J. Yoon, J.-H. Ahn, T. J. Park, D. M. Kim, D. H. Kim, S.-J. Choi"TCAD-Based Simulation Method for the Electrolyte–Insulator–Semiconductor Field-Effect Transistor"IEEE Transactions on Electron Devices, vol. 62, no. 3, pp. 1072-1075, 2015-03