Prof. Kim`s R.P.

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  • 197 J. Yoon, J. Park, B. Choi, Y. Lee, Y. Kim, H.-J. Kim, D. M. Kim, D. H. Kim, S.-J. Choi "3D printing-based pressure sensor with porous dielectric elastomer for healthcare monitoring" The 26th Korean Conference on Semiconductors, 2019-02
  • 196 H. B. Yoo, S. K. Kim, J. Kim, J. Yu, J. Kim, S.-J. Choi, D. H. Kim, D. M. Kim "Characterization of Subgap Density-of-States from Sub-bandgap Optical Charge Pumping in In0.53Ga0.47As MOSFETs " The 26th Korean Conference on Semiconductors, 2019-02
  • 195 S. Park, S. Choi, J. Rhee, S.-J. Choi, D. M. Kim, D. H. Kim "Observation of the peroxide formation and a negative ΔVT under current-driving condition in IZO TFTs with self-aligned top-gate structure" The 26th Korean Conference on Semiconductors, 2019-02
  • 194 D. Kim, J. T. Jang, J. Min, J. Park, D. M. Kim, S.-J Choi, H.-S. Mo, D. H. Kim "Influence of the Oxygen Content in IGZO on the Pattern Recognition Rate in Pd/IGZO/p+-Si Memristors" The 26th Korean Conference on Semiconductors, 2019-02
  • 193 D. Kim, J. T. Jang, J. Min, J. Park, D. M. Kim, S.-J Choi, H.-S. Mo, D. H. Kim "Influence of the Oxygen Content in IGZO on the Pattern Recognition Rate in Pd/IGZO/p+-Si Memristors" The 26th Korean Conference on Semiconductors, 2019-02
  • 192 Y. Lee, B. Choi, J. Yoon, J. Park, Y. Kim, H. B. Yoo, J. T. Jang, G. Ahn, H. R. Yu, H.-J. Kim, D. H. Kim, D. M. Kim, S. Kim*, S.-J. Choi*(co-corresponding authors) "Semiconducting carbon nanotube Schottky diode and integrated circuit applications" IEEE International Conference on Nanotechnology, 2018-07
  • 191 S. Choi, S. Kim, J. Jang, G. Ahn, J. T. Jang, T. J. Park, B.-G Park, D. M. Kim, S.-J. Choi, S. M. Lee, H.-S. Mo and D. H. Kim "Artificial Synapse and Neuron Combining the Ion-Sensitive Field-Effect Transistor and Memristor" IMCS 2018, 2018-07
  • 190 J. T. Jang, H. R. Yu, G. Ahn, S.-J. Choi, D. M. Kim, Y.-S. Kim, S. Oh, J. H. Baeck, J. U. Bae, K.-S. Park, S. Y. Yoon, I. B. Kang, and D. H. Kim "Universal Method to Determine the Dynamic NBIS- and PBS-induced Instabilities on Self-aligned Coplanar InGaZnO Thin-film Transistors" Society of Information Display, 2018-05
  • 189 J. T. Jang, G. Ahn, D. Ko, H. R. Yu, H. Jung, C. Yoon, S. Lee, B. H. Park, H.-S. Mo, S.-J. Choi, D. M. Kim, and D. H. Kim "SPICE-based Simulation Study of Cu/AlOx/Pt Conductive-Bridge Resistive Access Memory-CMOS Integrated Circuit for Reconfigurable Logic" The 24th Korean Conference on Semiconductors, 2018-02
  • 188 B. Choi, J. Yoon, Y. Lee, J. Han, J. Lee, Y. Kim, J. Park, D. M. Kim, D. H. Kim, and S.-J. Choi* "A pseudo-CMOS inverter with top-gated 99% semiconducting carbon nanotube network transistors" The 24th Korean Conference on Semiconductors, 2018-02
  • 187 Y. Lee, B. Choi, J. Yoon, J. Han, J. Lee, J. Park, Y. Kim, D. M. Kim, D. H. Kim, and S.-J. Choi* "99% semiconducting carbon nanotube-based diode and application in logic circuits" The 24th Korean Conference on Semiconductors, 2018-02
  • 186 J. Park, B. Choi, J. Yoon, Y. Lee, J. Han, J. Lee, Y. Kim, D. M. Kim, D. H. Kim, and S.-J. Choi* "Directly drawn carbon nanotube transistors with a high device yield and uniform performance" The 24th Korean Conference on Semiconductors, 2018-02
  • 185 Y. Kim, B. Choi, J. Yoon, Y. Lee, J. Han, J. Lee, J. Park, D. M. Kim, D. H. Kim, and S.-J. Choi* "Optimization of the performance in humidity sensor based on pre-separated 99% metallic single-walled carbon nanotube" The 24th Korean Conference on Semiconductors, 2018-02
  • 184 G. Ahn, J. T. Jang, D. Ko, H. Yu, H. Jung, J. Rhee, H.-S. Mo, S.-J. Choi, D. M. Kim, D. H. Kim "Analysis of LRS retention fail based on Joule heating effect in InGaZnO RRAM" The 24th Korean Conference on Semiconductors, 2018-02
  • 183 S. Choi, J.-Y. Kim, J. Kim, J. Rhee, H. R. Yu, H. Kang, S.-J. Choi, D. M. Kim, and D. H. Kim "Extraction Method of Temperature-Independent Subgap Density-of-States of a-IGZO TFTs by using Fermi-Dirac distribution" The 24th Korean Conference on Semiconductors, 2018-02
  • 182 H. R. Yu, J. T. Jang, G. Ahn, S.-J. Choi, D. M. Kim, and D. H. Kim "Study on Negative Bias Stress-induced Instability in Zinc Oxynitride Thin-Film Transistors using Systematic Decomposition" The 24th Korean Conference on Semiconductors, 2018-02
  • 181 J. T. Jang, S.-J. Choi, D. M. Kim, D. H. Kim "Activation Energy Window-Based Modeling on the NBIS-induced Instability in Amorphous InGaZnO Thin-Film Transistors" ICEIC, 2018-01
  • 180 J. Yoon†, B. Choi†, Y. Lee, J. Han, J. Lee, J. Park, Y. Kim, D. M. Kim, D. H. Kim, M.-H. Kang, S. Kim*, S.-J. Choi*( †These authors equally contributed to this work)(*co-corresponding authors) "Monolithically 3D-Printed Pressure Sensors for Application in Electronic Skin and Healthcare Monitoring" IEDM, 2017-12
  • 179 J. Yoon§, B. Choi§, Y. Lee, J. Lee, J. Park, Y. Kim, D. M. Kim, D. H. Kim, M.-H. Kang, S. Kim, and S.-J. Choi "Monolithically 3D-Printed Pressure Sensors for Application in Electronic Skin Healthcare Monitoring" IEDM, 2017-09
  • 178 J. Rhee, S. Choi, J.-Y. Kim, S.-J. Choi, D. M. Kim,and D. H. Kim* "Relationship between the tunneling distance and stretched-exponential function model on the positive bias stress-induced charge trapping in IGZO TFTs" IMID 2017, 2017-08
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