Prof. Kim`s R.P.

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  • 161 S. K. Kim, D.-M. Geum, J. Lee, M.-S. Park, J.-P. Shim, C. Z. Kim, H.-J. Kim, J.-D. Song, W. J. Choi, S.-J. Choi, D. H. Kim, S. H. Kim, D. M. Kim "The fabrication of InGaAs MOSFET with Y2O3 gate insulator" The 23st Korean Conference on Semiconductors(KCS 2016), p. 270, 2016-02
  • 160 Y. Lee, J. Yoon, B. Choi, J. Lee, M. Jeon, J. Han, J. Lee D. M. Kim, D. H. Kim, and S.-J. Choi "Hybrid complementary inverter for solution-processed single-walled carbon nanotube and a-IGZO thin-film transistors" The 23st Korean Conference on Semiconductors(KCS 2016), p. 215, 2016-02
  • 159 J.-Y. Kim, S. Choi, H. Kang, J. Kim, S.-J. Choi, D. M. Kim. D. H. Kim "Compartmentalization of the Physical Origin on the VT Variation of IGZO TFT under Current Stress by Combining I-V Curve and TCAD" The 23st Korean Conference on Semiconductors(KCS 2016), p. 43, 2016-02
  • 158 J. Park, K. M. Lee, D. M. Kim, S.-J. Choi, D. H. Kim "The density-of-states based C-V extraction in amorphous In-Ga-Zn-O thin-film transistors and the 3D TCAD-based verification" 2015년도 정기총회 및 추계학술대회, 2015-11
  • 157 R. Lee, D. W. Kwon, S. Kim, D. H. Kim, B.-G. Park "Investigation of Sensor Performance in Tunneling Field Effect Transistor (TFET) as Highly Sensitive and Multi-Sensing Biosensors" 28th International Microprocesses and Nanotechnology Conference (MNC), 2015-11
  • 156 S. Kim, D. W. Kwon, R. Lee, D. H. Kim, B.-G. Park "Investigation of Drift Effect on Silicon Nanowire Field Effect Transistor Based pH Sensor" 28th International Microprocesses and Nanotechnology Conference (MNC), 2015-11
  • 155 S. Kim, J. H. Lee, D. M. Kim, S. -J. Choi, B. -G. Park, D. H. Kim, and H. -S. Mo "CURRENT-MIRROR TYPE SILICON NANOWIRE BIOSENSOR WITH PROGRAMMABLE CURRENT REFERENCE" 19th International Conference on Miniaturized Systems for Chemistry and Life Sciences (MicroTAS 2015), 2015-10
  • 154 J. Kim, H. M. Choi, H.-S. Mo, J. H. Lee, D. M. Kim, S.-J. Choi, B.-G. Park, D. H. Kim, and J. Park "ANALYSIS OF HYSTERESIS AND DYNAMIC TRANSFER CHARACTERISTICS BY TIME DEPENDENCE IN SINW BIOSENSOR" 19th International Conference on Miniaturized Systems for Chemistry and Life Sciences (MicroTAS 2015), 2015-10
  • 153 S. Choi, J. Kim, J. Kim, J. T. Jang, H. Kang, D. M. Kim, S.-J. Choi, J. C. Park, D. H. Kim "Positive Bias Stress in Flowing Drain Current-induced Degradations in Self-Aligned Top-Gate a-IZO TFTs" IMID 2015 DIGEST, 2015-08
  • 152 J. Kim, J. T. Jang, S. Choi, J. Kim, H. Kang, S.-J. Choi, D. M. Kim, D. H. Kim "Analysis of hump characteristics induced self-heating and charge trapping in bottom-gate etch-stopper a-IGZO TFTs after simultaneous positive gate and drain bias stress" IMID 2015 DIGEST, 2015-08
  • 151 H. Kang, J. T. Jang, S.-J. Choi, D. M. Kim, D. H. Kim "Investigation of PBS-induced instability under various stress condition in a-IGZO TFT" 대한전자공학회 하계학술대회, 2015-06
  • 150 J. Kim, J. Kim, S. Choi, D. M. Kim, S.-J. Choi, D. H. Kim "The Analysis of Instability for Oxygen Flow Rate in Positive Bias Stress on High Gate Voltage or High Drain Voltage in a-IGZO Bottom-gate TFT" 대한전자공학회 하계학술대회, 2015-06
  • 149 S. Choi, Y. Kang, J. Kim, S.-J. Choi, D. M. Kim, H.-Y. Cha, H. Kim, D. H. Kim "Frequency-dependent C-V Based Extraction of Interface Trap Density in Normally-off Gate-recessed AlGaN/GaN Field-effect Transistors" ICEIC 2015, 2015-02
  • 148 J.T. Jang, H. Kang, J.H. Kim, S.-J. Choi, D. M. Kim, D. H. Kim "Analysis on the low VGS/high VDS stress-induced instability in amorphous indium-gallium-zinc-oxide thin-film transistors" ICEIC 2015, 2015-02
  • 147 J. Kim, S. Choi, J. Jang, J. T. Jang, J. Kim, S.-J. Choi, D. M. Kim, and D. H. Kim "Analysis of instability mechanism under simultaneous positive gate and drain bias stress in self-aligned top-gate amorphous indium-zinc-oxide thin-film transistors" The 22st Korean Conference on Semiconductors(KCS 2015), p. 334, 2015-02
  • 146 S. Choi, Y. Kang, J. Kim, J. Kim, S.-J. Choi, D. M. Kim, H.-Y. Cha, H. Kim., and D. H. Kim "Extraction of Interface Trap Density by using frequency dispersion of C-V in Normally-off Gate-recessed AlGaN/GaN HFET" The 22st Korean Conference on Semiconductors(KCS 2015), p. 28, 2015-02
  • 145 H. Kang, J. T. Jang, J. Kim, S.-J. Choi, D. M. Kim, and D. H. Kim "Comparative analysis on positive bias stress-induced instability under HVGS and HVDS in amorphous InGaZnO thin-film transistors" The 22st Korean Conference on Semiconductors(KCS 2015), p. 337, 2015-02
  • 144 H. M. Choi, J. Park, D. J. Shin, B. Choi, S. Kim, H. Mo, D. M. Kim, S.-J. Choi, D. H. Kim "Biosensing comparison between dry and wet environment in silicon nanowire transistor" The 22st Korean Conference on Semiconductors(KCS 2015), 2015-02
  • 143 J. Choi, Y. Kang, S. Choi, D. H. Kim, H.-Y. Cha, and H. Kim "Extraction of Interface Trap Density Through Differential Subthreshold Ideality Factor Technique in Normally-off AlGaN/GaN MOSHFETs" 제4회 한국광전자학회(The 4th Conference on Korea Society of Optoelectronics), Nov., 2014-11
  • 142 D. H. Kim, J. Jang, K. M. Lee, S. -J. Choi, and D. M. Kim "Subgap Density-of-States (DOS)-based Simulation for Instability-Aware Design of Oxide TFTs" CAD-TFT 2014, 2014-10
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