128S. Choi, J. Jang, H. Kim, J. Jang, J. Lee, C. Jo, S. Jun, K. M. Kim, D. J. Shin, S.-J. Choi, D. M. Kim, and D. H. Kim"Constant current stress-induced instability of the top-gate IZO TFTs for AMOLED displays"The 21st Korean Conference on Semiconductors(KCS 2014), p. 107, 2014-02
127D. Shin, S. Jun, K. M. Lee, H. Kim, C. Jo, J. Jang, J. Lee, S.-J. Choi, D. M. Kim, and D. H. Kim"Effect of ultra-thin active layer thickness on the subthreshold slope and bipolar bias stress-induced degradation in amorphous InGaZnO thin-film transistors"The 21st Korean Conference on Semiconductors(KCS 2014), p. 52, 2014-02
126H. Kim, J. Jang, J. Lee, C. Jo, S. Jun, K. Min Lee, D. J. Shin, J. Jang, S. Choi, S.-J. Choi, D. M. Kim, and D. H. Kim"Effect of gate/drain voltage configuration on electrical degradation of the bottom-gate In-Ga-Zn-O thin-film transistors driving AMOLED displays"The 21st Korean Conference on Semiconductors(KCS 2014), p. 111, 2014-02
125J. T. Jang, K. M. Lee, H. Kim, J. Jang, D. J. Shin, S. Choi, J. Lee, C. Jo, S. Jun, S.-J. Choi, D. M. Kim, and D. H. Kim"Effect of the RF power in sputter system on performance and photoelectric degradation of amorphous indium-gallium-zinc-oxide thin-film transistors"The 21st Korean Conference on Semiconductors(KCS 2014), p. 56, 2014-02
124K. M. Lee, S. Jun, H. Kim, C. Jo, J. Jang, J. Lee, D. J. Shin, J. T. Jang, S. Choi, S.-J. Choi, D. M. Kim, and D. H. Kim"Oxygen vacancy-dependent density-of-states and its effect on the negative bias illumination stress-induced degradation in amorphous oxide semiconductor thin-film transistors"The 21st Korean Conference on Semiconductors(KCS 2014), p. 54, 2014-02
123J. Lee, J. Jang, H. Kim, C. Jo, S. Jun, K. M. Lee, D. J. Shin, J. Jang, S. Choi, S.-J. Choi, D. M. Kim, and D. H. Kim"The Effect of Passivation on the Positive Bias Stress-Induced Instability of Polymer Thin-Film Transistors"The 21st Korean Conference on Semiconductors(KCS 2014), p. 296, 2014-02
122C. Jo, H. Kim, S. Jun, D. J. Shin, K. M. Lee, J. Jang, J. Lee, J. Jang, S. Choi, S.-J. Choi, D. M. Kim, and D. H. Kim"Study on Physical Mechanism on the Positive Bias Stress-Induced Degradation ofAmorphous InGaZnO Thin-Film Transistors with Density-of-States BasedCharacterization"The 21st Korean Conference on Semiconductors(KCS 2014), p. 96, 2014-02
121D. H. Kim, K.-M. Lee, and J. T. Jang"Material Effects on Photoelectric Instability of Amorphous Oxide Thin-Film Transistors"ICEIC 2014, Kota Kinabalu, Malaysia, 2014-01
120J. Lee, S. Hwang, B. Choi, J. H. Lee, B.-G. Park, D.-I. Moon, M.-L. Seol, C.-H. Kim, Y.-K. Choi, D. M. Kim, D. H. Kim, S.-J. Choi"A Novel SiNW/CMOS Hybrid Biosensor for High Sensitivity/Low Noise"IEDM Dig. Tech. Papers, 2013-12
119J. Jang, J. Lee, H. Kim, J. Lee, J. W. Chung, B. Lee, D. M. Kim, S.-J. Choi, D. H. Kim"Inkjet Printed Polymer SRAM-cell Design for Flexible FPGA with Physical Parameter-Based TFT Model"IEDM Dig. Tech. Papers, 2013-12
118T. S. Kim, H.-S. Kim, J. S. Park, K. S. Son, E. S. Kim, J.-B. Seon, S. Lee, S.-J. Seo, S.-J. Kim, S. Jun., K. M. Lee, D. J. Shin, J. Lee, C. Jo, D. H. Kim, M. Ryu, S.-H. Cho and Y. Park"High performance gallium-zinc oxynitride thin film transistors for next-generation display applications"IEDM Dig. Tech. Papers, 2013-12
117J. Lee, S. Hwang, B. Choi, S. Choi, J. H. Lee, B.-G. Park, D. M. Kim, S.-J. Choi and D. H. Kim"Noise-Immune Silicon Nanowire/CMOS Hybrid Biosensor Using Top-Down Approach"MicroTAS 2013, 2013-10
116J. Lee, J. Jang, S.-J. Choi, D. M. Kim, and D. H. Kim"Top-Down Silicon Nanowire FETs for Biosensors"ITC-CSCC 2013, p.144, 2013-07
115J. Jang, J. Lee, H. Kim, S.-J. Choi, D. M. Kim, and D. H. Kim"Density-of-States Based Numerical and Analytical Models for Solution-Processed Polymer TFTs"ITC-CSCC 2013, p.357, 2013-07
114D. H. Kim, K. M. Lee, S.-J. Choi, and D. M. Kim"Density-of-States Based Modeling of Oxide Thin-Film Transistors: Toward Instability-Aware Design"AWAD 2013, p.67, (Invited talk), 2013-06
113C. Jo, H. Bae, S. Jun, H. Choi, S. Hwang, D. H. Kim, and D. M. Kim"Characterization of Asymmetrical Negative Bias Stress Effect on the Density-of-States and Parasitic Resistances in a-IGZO Thin-Film Transistors"in SID'13 Dig. Tech. Papers, 2013-05
112H. Bae, S. Jun, H. Choi, C. H. Jo Y. H. Kim, J. S. Hwang, J. Ahn, D. H. Kim, and D. M. Kim"Separate Extraction Technique of Intrinsic Donor- and Acceptor-like Density-of-States over Full-Energy Range Sub-bandgap in Amorphous Oxide Semiconductor Thin Film Transistors by Using One-Shot Monoch"in SID'13 Dig. Tech. Papers, 2013-05
111J. Jang, J. Kim, J. Lee, C. Jo, S. Jun, H. Kim, S. Choi, D. M. Kim, J. Lee, B. Koo, J. W. Chung, and D. H. Kim"Density-of-States Based Device-Circuit Co-Design Platform for Solution-Processed Organic Integrated Circuits"in SID'13 Dig. Tech. Papers, 2013-05
110J. Lee, J. Jang, J. Kim, H. Kim, S. Choi, D. H. Kim, J. Lee, J. W. Chung, B. Koo, and D. M. Kim"Transfer Characteristic-Based Electro-Optical Technique for Characterization of Carrier Lifetimes with Associated Physical Mechanisms in Polymer-based Organic Thin-Film Transistors"in SID'13 Dig. Tech. Papers, 2013-05
109J. Jang, J. Kim, J. Lee, H. Kim, D. M. Kim, and D. H. Kim"Density-of-States (DOS)-based I-V and C-V Models and Link to Circuit Simulator for Polymer Thin Film Transistors (PTFTs)"The 20th Korean Conference on Semiconductors, 2013-02