Prof. Kim`s R.P.
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- 100 "Characterization of Free Electron-Deembedded Subgab Density-of-States in a-IGZO TFTs from the Sub-Bandgap Optical Subthreshold Characteristics" The 20th Korean Conference on Semiconductors, 2013-02
- 99 "Negative Bias Stress Instability Mechanism in Polymer-Based Thin-Film TransistorsThe 20th Korean Conference on Semiconductors" The 20th Korean Conference on Semiconductors, 2013-02
- 98 "Physical Model and Simulation Platform for High-Level Instability-Aware Design of Amorphous Oxide Semiconductor Thin-Film Transistors" in SID'12 Dig. Tech. Papers, 2012-05
- 97 "Characterization of Physical Parameter-Based Reliability on the Negative Bias Illumination Stress with Wavelength-Dependence in Amorphous Silicon Thin-Film Transistors" in SID'12 Dig. Tech. Papers, 2012-05
- 96 "Microscopic Mechanism of the Negative Bias and Illumination Stress Instability of Amorphous Oxide TFTs" in SID'12 Dig. Tech. Papers, 2012-05
- 95 "CMOS-Compatible Inverter-Type Si Nanoribbon Biosensor with High Sensitivity" The 19th Korean Conference on Semiconductors, 2012-02
- 94 "Amorphous Silicon 박막트랜지스터의 Negative Bias Illumination Stress 하에서의 물리적 Parameter 기반 신뢰성 특성 분석" The 19th Korean Conference on Semiconductors, 2012-02
- 93 "Active Layer Thickness-Dependent Parasitic Resistance Effect in Low Frequency Noise with Subgap Density-of-States in Amorphous Indium-Gallium-Zinc-Oxide TFTs" The 19th Korean Conference on Semiconductors, 2012-02
- 92 "Differential Ideality Factor Technique and Extraction of Subgap Density-of-States in Amorphous InGaZnO Thin-Film Transistors" The 19th Korean Conference on Semiconductors, 2012-02
- 91 "Characterization of Intriinsic Field Effect Mobiliity in a-IGZO Thin-Film Transistors Through the De-embedding the Parasitic Source and Drain Resistance Effects" The 19th Korean Conference on Semiconductors, 2012-02
- 90 "Characterization of Density-of-States in olymer-based Organic Thin Film Transistors and Implementation into TCAD Simulator" The 19th Korean Conference on Semiconductors, 2012-02
- 89 "Analytical Model-based SPICE Simulation ofr the Design of Amorphous InGaZnO Thin-Film Transistors-based Circuits" The 19th Korean Conference on Semiconductors, 2012-02
- 88 "Si/SiGe Vertical Gate DHBT (VerDHBT)-based 1T DRAM Cell For Improved Retention Characteristics With a Large Hysteresis window" The 19th Korean Conference on Semiconductors, 2012-02
- 87 "Separate Extraction Technique of Gate, Source, Drain, and Substrate Resistances in Individual MOSFET Combining I-V and C-V Characteristics" The 19th Korean Conference on Semiconductors, 2012-02
- 86 "Analysis of hysteresis characteristics of fabricated SiNW biosensor in aqueous environment with reference electrode" Silicon Nanoelectronics Workshop (SNW), 2012 IEEE Digital Object Identifier, 2012-
- 85 "Analytical of current hysteresis of SiNW in the aqueous solution depending on measurement biases" 2011 11th IEEE NANO, 2011-08
- 84 "Density-of-States Based Analysis on the Effect of Active Thin-film Thickness on Current Stress-induced Instability in Amorphous InGaZnO AMOLED Driver TFTs" in SID'11 Dig. Tech. Papers, 2011-05
- 83 "Analytical I-V and C-V Models for Amorphous InGaZnO TFTs and their Application to Circuit Simulations" in SID'11 Dig. Tech. Papers, 2011-05
- 82 "Quantitative Analysis of Negative Bias Illumination Stress-Induced Instability Mechanisms in Amorphous InGaZnO Thin-Film Transistors" The 18th Korean Conference on Semiconductors, 2011-02
- 81 "The oxygen flow-rate-dependence of electrical stress-induced instability of amorphous InGaZnO thin-film transistors" The 18th Korean Conference on Semiconductors, 2011-02
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