100H. Seo, H. Bae, C. Jo, E. Hong, H. Choi, J. S. Hwang, J. Ahn, D. H. Kim, and D. M. Kim"Characterization of Free Electron-Deembedded Subgab Density-of-States in a-IGZO TFTs from the Sub-Bandgap Optical Subthreshold Characteristics"The 20th Korean Conference on Semiconductors, 2013-02
99J. Lee, J. Jang, J. Kim, S. Jun, C. Jo, Y. H. kim, W. Kim, I. Hur, H. Kim, K. M. Lee, D. J. Shin, D. M. Kim, and D. H. Kim"Negative Bias Stress Instability Mechanism in Polymer-Based Thin-Film TransistorsThe 20th Korean Conference on Semiconductors"The 20th Korean Conference on Semiconductors, 2013-02
98D. H. Kim, W. Kim, Y. Kim, I. Hur, M. Bae, D. Kong, H. K. Jeong, D. M. Kim"Physical Model and Simulation Platform for High-Level Instability-Aware Design of Amorphous Oxide Semiconductor Thin-Film Transistors"in SID'12 Dig. Tech. Papers, 2012-05
97H. K. Jeong, I. Hur, W. Kim, J. Kim, D. Kong, Y. Kim, M. Bae, S. Choi, D. M. Kim, and D. H. Kim"Characterization of Physical Parameter-Based Reliability on the Negative Bias Illumination Stress with Wavelength-Dependence in Amorphous Silicon Thin-Film Transistors"in SID'12 Dig. Tech. Papers, 2012-05
96Y.-S. Kim, H.-H. Nahm, and D. H. Kim"Microscopic Mechanism of the Negative Bias and Illumination Stress Instability of Amorphous Oxide TFTs"in SID'12 Dig. Tech. Papers, 2012-05
95J. Lee, J. H. Lee, H. Jang, M. Uhm, W. H. Lee, S. Hwang, B.-G. Park, I.-Y. Chung, D. M. Kim and D. H. Kim"CMOS-Compatible Inverter-Type Si Nanoribbon Biosensor with High Sensitivity"The 19th Korean Conference on Semiconductors, 2012-02
94정현광, 공동식, 김용식, 배민경, 김재형, 김우준, 허인석, 이재욱, 김윤혁, 전성우, 조춘형, 김동명, 김대환"Amorphous Silicon 박막트랜지스터의 Negative Bias Illumination Stress 하에서의 물리적 Parameter 기반 신뢰성 특성 분석"The 19th Korean Conference on Semiconductors, 2012-02
93H. Bae, D. Kong, J. S. Shin, D. Yun, E. Hong, H. Seo, H. Choi, J. Lee, H.-K. Jung, M. Bae, Y. Kim, W. Kim, D. H. Kim, and D. M. Kim"Active Layer Thickness-Dependent Parasitic Resistance Effect in Low Frequency Noise with Subgap Density-of-States in Amorphous Indium-Gallium-Zinc-Oxide TFTs"The 19th Korean Conference on Semiconductors, 2012-02
92M. Bae, D. Yun, Y. Kim, D. Kong, H. Jeong, J. Jang, W. Kim, I. Hur, J. Kim, Y. H. Kim, J. Lee, S. Jun, C. H. Jo, D. H. Kim, and D. M. Kim"Differential Ideality Factor Technique and Extraction of Subgap Density-of-States in Amorphous InGaZnO Thin-Film Transistors"The 19th Korean Conference on Semiconductors, 2012-02
91I. Hur, H. Bae, M. Bae, Y. Kim, D. Kong, H. Jeong, J. Jang, J. Kim, W. Kim, Y. H. Kim, J. Lee, S. Jun, C. H. Jo, D. M. Kim, and D. H. Kim"Characterization of Intriinsic Field Effect Mobiliity in a-IGZO Thin-Film Transistors Through the De-embedding the Parasitic Source and Drain Resistance Effects"The 19th Korean Conference on Semiconductors, 2012-02
90J. Kim, J. Jang, M. Bae, W. Kim, I. Hur, Y. Kim, H. Jeong, D. Kong, J. Lee, Y. H. Kim, S. Jun, C. H. Jo, D. M. Kim,and D. H. Kim"Characterization of Density-of-States in olymer-based Organic Thin Film Transistors and Implementation into TCAD Simulator"The 19th Korean Conference on Semiconductors, 2012-02
89김우준, 배민경, 김용식, 김재형, 허인석, 장재만, 정현광, 공동식, 김윤혁 이재욱, 조춘형, 전성우, 김동명, 김대환"Analytical Model-based SPICE Simulation ofr the Design of Amorphous InGaZnO Thin-Film Transistors-based Circuits"The 19th Korean Conference on Semiconductors, 2012-02
88J. S. Shin, H. Choi, H. Bae, J. Jang, D. Yun, E. Hong, H. Seo, D. H. Kim, and D. M. Kim"Si/SiGe Vertical Gate DHBT (VerDHBT)-based 1T DRAM Cell For Improved Retention Characteristics With a Large Hysteresis window"The 19th Korean Conference on Semiconductors, 2012-02
87J. S. Shin, H. Bae, E. Hong, J. Jang, D. Yun, H. Seo, H. Choi, D. H. Kim, and D. M. Kim"Separate Extraction Technique of Gate, Source, Drain, and Substrate Resistances in Individual MOSFET Combining I-V and C-V Characteristics"The 19th Korean Conference on Semiconductors, 2012-02
86J. H. Lee, J. Lee, M-C Sun, W. H. Lee, M Uhm, S. Hwang, I-Y Chung, D. M. Kim, D. H. Kim, and B-G Park"Analysis of hysteresis characteristics of fabricated SiNW biosensor in aqueous environment with reference electrode"Silicon Nanoelectronics Workshop (SNW), 2012 IEEE Digital Object Identifier, 2012-
85H. Jang, J. Lee, J. H. Lee, H. Seo, M. Uhm, W. H. Lee, D. M. Kim, I.-Y. Chung and D. H. Kim"Analytical of current hysteresis of SiNW in the aqueous solution depending on measurement biases"2011 11th IEEE NANO, 2011-08
84D. Kong, H. Jung, Y. Kim, M. Bae, Y. W. Jeon, S. Kim, J. Jang, J. Kim, W. Kim, I. Hur, D. M. Kim, D. H. Kim, B. D. Ahn, S. Y. Park, J.-H. Park, J. H. Kim, J. Park, and J.-H. Lee"Density-of-States Based Analysis on the Effect of Active Thin-film Thickness on Current Stress-induced Instability in Amorphous InGaZnO AMOLED Driver TFTs"in SID'11 Dig. Tech. Papers, 2011-05
83M. Bae, Y. Kim, W. Kim, D. Kong, H. Jung, Y. W. Jeon, S. Kim, I. Hur, J. Kim, D. M. Kim, D. H. Kim, B. D. Ahn, S. Y. Park, J.-H. Park, J. H. Kim, J. Park, and J.-H. Lee"Analytical I-V and C-V Models for Amorphous InGaZnO TFTs and their Application to Circuit Simulations"in SID'11 Dig. Tech. Papers, 2011-05
82Y. Kim, S. Kim, Y. Jeon, M.-K. Bae, D. S. Kong, H. K. Jung, J. Lee, J. Jang, J. Kim, W. Kim, I. Hur, D. M. Kim, and D. H. Kim"Quantitative Analysis of Negative Bias Illumination Stress-Induced Instability Mechanisms in Amorphous InGaZnO Thin-Film Transistors"The 18th Korean Conference on Semiconductors, 2011-02
81S. Kim, Y. Jeon, Y. Kim, D. S. Kong, H. K. Jung, M.-K. Bae, J. Lee, J. Jang, H. Jang, J. Kim, W. Kim, I. Hur, J.-S. Lee, D. M. Kim, and D. H. Kim"The oxygen flow-rate-dependence of electrical stress-induced instability of amorphous InGaZnO thin-film transistors"The 18th Korean Conference on Semiconductors, 2011-02