Prof. Bae`s R.P.

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  • 8 J.-H. Bae, and J. H. Lee "Dual-gate p-GaN gate HEMTs for steep subthreshold slope" The 22nd Korean Conference on Semiconductors (KCS), 2015-02
  • 7 J.-H. Bae, S. Hwang, J. Shin, H.-I. Kwon, C. H. Park, H. Choi, J.-B. Park, J. Kim, J. Ha, K. Park, J. Oh, J. Shin, U-I. Chung, K.-S. Seo, and J.-H. Lee "Analysis of DC/transient current and RTN behaviors related to traps in p-GaN gate HEMT" 2013 International Electron Devices Meeting (IEDM), 2013-12
  • 6 G. Kim, E. Park, J. H. Kim, J.-H. Bae, D. H. Kang, and B.-G. Park "Trap analysis of InGaN-based blue light emitting diodes using current-transient methodology" 2013 International Conference on Solid State Devices and Materials (SSDM), 2013-09
  • 5 J.-H. Bae, M. Jang, C. H. Park, B.-G. Park, and J.-H Lee "Characterization of low frequency noise in PtSi source/drain Schottky barrier junction SOI MOSFETs" The 20th Korean Conference on Semiconductors (KCS), 2013-02
  • 4 J.-H. Bae, I. Hwang, J.-M. Shin, H.-I. Kwon, C. H. Park, J. Ha, J. Lee,H. Choi, J. Kim, J.-B. Park, J. Oh, J. Shin, U-I. Chung, and J.-H. Lee "Characterization of Traps and Trap-Related Effects in Recessed-Gate Normally-off AlGaN/GaN-based MOSHEMT" 2012 International Electron Devices Meeting (IEDM), 2012-12
  • 3 M.-K. Jeong, S.-M. Joe, B.-S. Jo, H.-J. Kang, J.-H. Bae, K.-R. Han, E. Choi, G. Cho, S.-K. Park, B.-G. Park, and J.-H Lee "Characterization of traps in 3-D stacked NAND flash memory devices with tube-type poly-Si channel structure" 2012 International Electron Devices Meeting (IEDM), 2012-12
  • 2 J.-H. Bae, C.-H. Kim, and J.-H. Lee "Characterization of floating-base bipolar junction transistor as a 2-terminal select device for cross-point memory devices" The 19th Korean Conference on Semiconductors (KCS), 2012-02
  • 1 S.-M. Joe, M.-K. Jeong, M.-S. Lee, B.-S. Jo, J.-H. Bae, S.-K. Park, K.-R. Han, J.-H. Yi, G.-S. Cho, and J.-H. Lee "Extraction of 3-D trap position in NAND flash memory considering channel resistance of pass cells and bit-line interference" 2011 Symposium on VLSI Technology (VLSIT), 2011-06