Conference
Home > Publications > Conference
- 27 "Optical Trap-Assisted Tunneling Current Method for Extracting thr Interface-State Density in the Gate-to-Drain Overlapped Region of MOSFETs" The 13th Korean Conference on Semiconductors, vol. 2, pp. 817-818, 2006-02
- 26 "Sub-Bandgap Photonic Base Current Method for Extracting the Trap Density at Hetero-Interface in Heterojunction Bipolar Transistors" The 13th Korean Conference on Semiconductors, vol. 1, pp. 153-154, 2006-02
- 25 "Characterization of interface states in the gate-to-drain overlapped region of MOSFETs using GIDL current under sub-bandgap photonic excitation" IT-SOC conference(한국소프트웨어진흥원), pp. 455-457, 2005-11
- 24 "A New Technique for Extracting the Source and Drain Resistances in MOSFETs using Parasitic Bipolar Transistor with Substrate Contact as a Base" The 12th Korean Conference on Semiconductors, vol. 1, pp. 331-332, 2005-02
- 23 "Analysis of Interface Traps in MOSFETs using a Novel Off-State Drain Leakage Characteristics under Sub-Bandgap Photonic Excitation" The 11th Korean Conference on Semiconductors, vol. 2, pp. 235-236, 2004-02
- 22 "Characterization of Interface States in HBTs using a Novel Photonic Base Current Analysis" The 11th Korean Conference on Semiconductors, vol. 1, pp. 489-490, 2004-02
- 21 "Extraction of Hot-Carrier Induced Interface States in MOSFETs Using the Sub-Bandgap Photonic Gated-Diode Method" The 11th Korean Conference on Semiconductors, vol. 2, pp. 207-208, 2004-02
- 20 "Modeling of Substrate Current and Characterization of Trpas in MOSFETs under Sub-Bandgap Photonic Excitation" The 11th Korean Conference on Semiconductors, vol. 2, pp. 231-232, 2004-02
- 19 "Optical Subthreshold Current Method with MOSFETs for Extracting the Distribution of Interface States in MOS Systmes" The 10th Korean Conference on Semiconductors, vol. 10, pp. 15-16, 2003-02
- 18 "Photonic Gated-Diode Method for Extracting the Energy-Dependent and Spatial Distributions of Interface States in MOSFETs" The 10th Korean Conference on Semiconductors, vol. 10, pp. 19-20, 2003-02
- 17 "Experimental and Qualitative InvestigatIon of Abnormal Gate Leakage Currents in Pseudomorphic HEMTs" 제8회 한국반도체학술대회 논문집, pp. 523-524,, 2001-02
- 16 "Extraction of Equivalent Device parameters in MOSFETs Combining C-V and I-V characteristics" 제8회 한국반도체학술대회 논문집, pp. 547-548, 2001-02
- 15 "Photonic Capacitance-Voltage Characteristics of MOS capacitors and Photonic Current-Voltage Characteristics of MOSFETs" 제8회 한국반도체학술대회 논문집, pp. 549-550, 2001-02
- 14 "새로운 ERM-방법에 의한 미세구조 N-채널 MOSFET의 유효 이동도와 소스 및 드레인 기생저항의 정확한 분리 추출:A Novel External Resistance Method for Extraction of Accurate Effective Mobility and separated Source/Drain Resistances in Submicron L" 대한전자공학회 논문지 SD편, 제37권 12호 pp. 999-I008, 2000-12
- 13 "Modeling and Extraction of Small-signal characteristic parameters with a New zero-gm Method in Submicron si-MOSFET's for Microwave Applications" Telecommunications Review, 2000-08
- 12 "A New Method for the Extraction of Effective Mobility and Separated Source/Drain Resistances in Submicron MOSFETs" 제7회 한국반도체학술대회 논문집, pp. 473-474, 2000-
- 11 "Modeling and Extraction of Small-signal Characteristic parameters in Submicron si-MOSFET's for Microwave Applications" 제7회 한국반도체학술대회 논문집, pp.471-472, 2000-
- 10 "0pmelectronic Control and Modeling of a High performance Field Effect Transistor as a Photonic Detector" 제5회 한국반도체학술대회 논문집, pp. 555-556, 1998-10
- 9 "Electrical Characteristics of an Optically Controlled N-channel si-MOSFET for Possible Application m OEICs on si Substrate" 대한전자공학회 하계종합학술대회 발표논문집, voI.21, no. 1, pp. 351-354, 1998-
- 8 "Optical ControlIed AlGaAs/GaAs/InGaAs Pseudomorphic MODFET" 제4회 한국반도체학술대회 논문집, pp. 19-20, 1997-
S!LK / TEL : 02-910-5350 / FAX : 02-910-4449
77, JEONGNEUNG-RO, SEONGBUK-GU, SEOUL, REPUBLIC OF KOREA [02707] KOOKMIN-UNIV 7TH BUILDING 7TH FLOOR NO.704
COPYRIGHT(c) 2013 Semiconductor Devices & !ntegrated Circuits Lab.@ KMU All rights reserved.
