40J. U. Lee, S. W. Kim, K. S .Roh, G. C. Kang, S. H. Seo, K. Y. Kim, C. H. Lee, S. Y. Lee, K. J. Song, C. M. Choi, S. R. Park, B. G. Park, H. Shin, J. D. Lee, K. S. Min, D. J. Kim, D. H. Kim, and D. M."Extraction of Si3N4 Trap Density Distribution in SONOS Flash Memories based on Optical C-V Method"The 14th Korean Conference on Semiconductors, Vol. 1, pp. 65-66, 2007-02
39Lee, S. Y, S. H. Seo, K. S .Roh, J. U. Lee, S. W. Kim, G. C. Kang, K. Y. Kim, C. H. Lee, S. Y. Lee, K. J. Song, C. M. Choi, S. R. Park, B. G. Park, H. Shin, J. D. Lee, K. S. Min, D. J. Kim, D. H. Kim,"Extraction of the Interface Trap Density in SONOS Flash Memory Cell Transistors by Optical Subthreshold Current Method"The 14th Korean Conference on Semiconductors, Vol. 2, pp. 1041-1042, 2007-02
38K. Y. Kim, K. S .Roh, G. C. Kang, S. H. Seo, S. W. Kim, C. H. Lee, J. U. Lee, S. Y. Lee, K. J. Song, C. M. Choi, S. R. Park, B. G. Park, H. Shin, J. D. Lee, K. S. Min, D. J. Kim, D. H. Kim, and D. M."Halo Doping-Dependence and Structural Optimization of Short Channel Effects in Partially Insulated MOSFETs(PiFETs)"The 14th Korean Conference on Semiconductors, Vol. 2, pp. 1085-1086, 2007-02
37K. S .Roh, S. H. Seo, S. Y. Lee, J. U. Lee, S. W. Kim, G. C. Kang, K. Y. Kim, C. H. Lee, K. J. Song, C. M. Choi, S. R. Park, B. G. Park, H. Shin, J. D. Lee, K. S. Min, D. J. Kim, D. H. Kim, and D. M."Lateral Profiling of Interface States in SONOS Flash Memories Using the Optical Charge Pumping Method"The 14th Korean Conference on Semiconductors, Vol. 2, pp. 1045-1046, 2007-02
36S. H. Seo, S. W. Kim, J. U. Lee, C. H. Lee, G. C. Kang, K. S .Roh, K. Y. Kim, S. Y. Lee, K. J. Song, C. M. Choi, S. R. Park, B. G. Park, H. Shin, J. D. Lee, K. S. Min, D. J. Kim, D. H. Kim, and D. M."Narrow Width Effect of an NROM-type SONOS Flash Memory Device on Program/Erase Cycling Behavior"The 14th Korean Conference on Semiconductors, Vol. 1, pp. 67-68, 2007-02
35K.-P Kang, K.-M. Kang, D.-K. Kwak, O-S. Kwon, D.-H. Lee, J.-G. Lee, D. M. Kim, D. J. Kim, H.-J. Song, D. H. Kim, and D.-S. Min"Low-Power Dynamic VTH Scaling (DVTS) Circuits using Charge-Recycling Technique for Leakage-Dominant VLSI’s""International SoC Design Conference, pp. 361-364, 2006-10
34Y. S. Yu, D. H. Kim, J. D. Lee, and B.-G. Park"Transport Spectroscopy of A Quantum Dot in SOI MOSFET""The 13th International Symposium on the Physics of Semiconductors and Applications, p. 116, 2006-08
33J.-U. Lee, K.-H. Baek, C. Olson, D. M. Kim, and A. Gopinath"Simulation of Self-assembled Photonic Crystals with Embedded Waveguide Using FDTD Method"Progress in Electromagnetic Research Symposium(PIERS), Cambridge, Massachusetts, 2006-03
32강경필, 최훈대, 강경민, 곽동곤, 권오삼, 김대환, 송호준, 김대정, 김동명, 민경식"Charge-Recycling Dynamic VTH Scaling (DVTS) Circuit for Leakage-Dominant VLSI’s"The 13th Korean Conference on Semiconductors, vol. 1, pp. 173-174, 2006-02
31곽동곤, 최훈대, 강경민, 권오삼, 김대환, 송호준, 김대정, 김동명, 민경식"Row-By-Row Activated SRAM with Process-VDD-Temperature (PVT) Fluctuation Adaptive Source-Line Biasing Circuit for Low-Leakage Sub-70-nm LSI’s"The 13th Korean Conference on Semiconductors, vol. 1, pp. 199-200, 2006-02
30강경민, 최훈대, 강경필, 곽동곤, 권오삼, 임진혁, 김대환, 송호준, 김대정, 김동명, 민경식"FPGA Implementation of Multi-Channel SDRAM Controller"The 13th Korean Conference on Semiconductors, vol. 1, pp. 579-582, 2006-02
29강경민, 최훈대, 강경필, 곽동곤, 권오삼, 임진혁, 김대환, 송호준, 김대정, 김동명, 민경식"Low-Latency and High-Bandwidth Multi-Channel SDRAM Controller Using Predictive Reordering Scheme for Multimedia SoC"The 13th Korean Conference on Semiconductors, vol. 2, pp. 925-926, 2006-02
28J. B. Choi, S. W. Kim, K. S. Roh, S. H. Seo, K. Y. Kim, C. H. Lee, S. Y. Lee, J. U. Lee, G. C. Kang, H. T. Kim, D. H. Kim, K. S. Min, D. J. Kim, and D. M. Kim"Optical Trap-Assisted Tunneling Current Method for Extracting thr Interface-State Density in the Gate-to-Drain Overlapped Region of MOSFETs"The 13th Korean Conference on Semiconductors, vol. 2, pp. 817-818, 2006-02
27J. B. Choi, S. W. Kim, K. S. Roh, S. H. Seo, K. Y. Kim, C. H. Lee, S. Y. Lee, J. U. Lee, G. C. Kang, H. T. Kim, D. H. Kim, K. S. Min, D. J. Kim, and D. M. Kim"Optical Trap-Assisted Tunneling Current Method for Extracting thr Interface-State Density in the Gate-to-Drain Overlapped Region of MOSFETs"The 13th Korean Conference on Semiconductors, vol. 2, pp. 817-818, 2006-02
26S. W. Kim, J. B. Choi, K. S. Roh, S. H. Seo, K. Y. Kim, C. H. Lee, S. Y. Lee, J. U. Lee, G. C. Kang, H. T. Kim, D. H. Kim, K. S. Min, D. J. Kim, and D. M. Kim"Sub-Bandgap Photonic Base Current Method for Extracting the Trap Density at Hetero-Interface in Heterojunction Bipolar Transistors"The 13th Korean Conference on Semiconductors, vol. 1, pp. 153-154, 2006-02
25최재복, 김세운, 서승환, 김관영, 강구철, 이장욱, 이충현, 노강섭, 이순영, 김해택, 김대환, 민경식, 김대정, 김동명"Characterization of interface states in the gate-to-drain overlapped region of MOSFETs using GIDL current under sub-bandgap photonic excitation"IT-SOC conference(한국소프트웨어진흥원), pp. 455-457, 2005-11
24I. C. Nam, H. T. Kim, K. S. Kim, K. H. Kim, J. B. Choi, J. U. Lee, S. W. Kim, G. C. Kang, K. S. Roh, D. J. Kim, K. S. Min, and D. M. Kim"A New Technique for Extracting the Source and Drain Resistances in MOSFETs using Parasitic Bipolar Transistor with Substrate Contact as a Base"The 12th Korean Conference on Semiconductors, vol. 1, pp. 331-332, 2005-02
23H. S. Park, H. T. Kim, T. E. Kim, H. T. Shin, K. S. Kim, I. C. Nam, K. H. Kim, J. B. Choi, J. U. Lee, S. H. Jeong, S. W. Kim, D. J. Kim, K. S. Min, and D. M. Kim"Analysis of Interface Traps in MOSFETs using a Novel Off-State Drain Leakage Characteristics under Sub-Bandgap Photonic Excitation"The 11th Korean Conference on Semiconductors, vol. 2, pp. 235-236, 2004-02
22. T. Shin, H. T. Kim, T. E. Kim, H. S. Park, K. S. Kim, I. C. Nam, K. H. Kim, J. B. Choi, J. U. Lee, S. H. Jeong, S. W. Kim, D. J. Kim, K. S. Min, and D. M. Kim"Characterization of Interface States in HBTs using a Novel Photonic Base Current Analysis"The 11th Korean Conference on Semiconductors, vol. 1, pp. 489-490, 2004-02
21T. E. Kim, H. T. Kim, H. T. Shin, H. S. Park, K. S. Kim, I. C. Nam, K. H. Kim, J. B. Choi, J. U. Lee, S. H. Jeong, S. W. Kim, D. J. Kim, K. S. Min, and D. M. Kim"Extraction of Hot-Carrier Induced Interface States in MOSFETs Using the Sub-Bandgap Photonic Gated-Diode Method"The 11th Korean Conference on Semiconductors, vol. 2, pp. 207-208, 2004-02